Referenced in: none

Automatically associated channels: Kv4.1

Title: Measurement of two dimensional refractive index profiles of channel waveguides using an interferometric technique.

Authors: R Oven

Journal, date & volume: Appl Opt, 2009 Oct 20 , 48, 5704-12

PubMed link: http://www.ncbi.nlm.nih.gov/pubmed/19844304

Abstract
Two dimensional refractive index profiles of ion exchanged channel waveguides in glass have been measured using an interferometric method. In order to obtain depth data, a shallow bevel is produced in the glass by polishing. A regularization algorithm for the extraction of the phase data from the interferometer image is presented. The method is applied to waveguides formed by the electric field assisted diffusion of Cu+ ions into a borosilicate glass. The index change obtained from the interferometer is in good agreement with that obtained from measurements on planar waveguides.